Nanoscale topography and spatial light modulator characterization using wide-field quantitative phase imaging

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We demonstrate an optical technique for large field of view quantitative phase imaging of reflective samples. It relies on a common-path interferometric design, which ensures high stability without the need for active stabilization. The technique provides single-shot, full-field and robust measurement of nanoscale topography of large samples. Further, the inherent stability allows reliable measurement of the temporally varying phase retardation of the liquid crystal cells, and thus enables real-time characterization of spatial light modulators. The technique’s application potential is validated through experimental results.

Tae Woo Kim Graduate Research Assistant Electrical and Computer Engineering Quantitative Light Imaging Laboratory 4053 Beckman Institute University of Illinois, Urbana-Champaign