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R. Zhou, C. Edwards, A. Arbabi, G. Popescu and L. Goddard, Detecting 20 nm wide defects in large area nanopatterns using optical interferometric microscopy, Nano Letters 13 (8), 3716-3721 (2013).

T. Kim, S. Sridharan, and G. Popescu, Gradient field microscopy of unstained specimens: reply to comment, Opt. Exp. 21 (16), 19188 (2013).

B. Bhaduri et al., Fourier phase microscopy with white light, Biomed. Opt. Exp. 4 (8), 1434-1441 (2013).

C. Edwards, et al., Digital projection photochemical etching defines gray-scale features, Opt. Exp., 21(11), pp.13547-13554 (2013)

$H. Pham et al., Fast phase reconstruction in white light diffraction phase microscopy, Appl. Opt. (Special Issue on Holography), 52 (1), A97-A101 (2013)$

H. Pham et al., Fast phase reconstruction in white light diffraction phase microscopy, Appl. Opt. (Special Issue on Holography), 52 (1), A97-A101 (2013)

C. Edwards, A. Arbabi, G. Popescu, and L. Goddard, Optically monitoring and controlling nanoscale topography during semiconductor etching, Nature-Light: Science & Applications, 1, e30 (2012).

B. Bhaduri and G. Popescu, Derivative method for phase retrieval in off-axis quantitative phase imaging, Optics Letters 37 (11), 2012

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