TY - JOUR T1 - Computational interference microscopy enabled by deep learning AU - Jiao,Yuheng AU - He,Yuchen R. AU - Kandel,Mikhail E. AU - Liu,Xiaojun AU - Lu,Wenlong AU - Popescu,Gabriel Y1 - 2021/04/01 PY - 2021 DA - 2021/04/01 N1 - doi: 10.1063/5.0041901 DO - 10.1063/5.0041901 T2 - APL Photonics JF - APL Photonics JO - APL Photonics SP - 046103 VL - 6 IS - 4 PB - American Institute of Physics M3 - doi: 10.1063/5.0041901 UR - https://doi.org/10.1063/5.0041901 Y2 - 2021/04/06 ER -