Archive: August, 2017

Gradient light interference microscopy for 3D imaging of unlabeled specimens

Posted on 08/14/17 by Chenfei Hu

PDF Link SI Multiple scattering limits the contrast in optical imaging of thick specimens. Here, we present gradient light interference microscopy (GLIM) to extract three-dimensional information from both thin and thick unlabeled specimens. GLIM exploits a special case of low-coherence interferometry to extract phase information from the specimen, which in turn can be used to […]

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