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iOptics
Mir et al., Quantitative Phase Imaging, Progress in Optics, Vol. 57, p 133-217 (2012)
August 13, 2012
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Pham et al., Spectroscopic diffraction phase microscopy, Opt. Lett., Vol. 37, No. 17 (2012)
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C. Edwards, A. Arbabi, G. Popescu, and L. Goddard, Optically monitoring and controlling nanoscale topography during semiconductor etching, Nature-Light: Science & Applications, 1, e30 (2012).
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